Hot electron effects on Al0.25Ga0.75As/GaAs power HFET's under off-state and on-state electrical stress conditions

✍ Scribed by Dieci, D.; Menozzi, R.; Lanzieri, C.; Polenta, L.; Canali, C.

• Book ID: 114538018
• Publisher: IEEE
• Year: 2000
• Tongue: English
• Weight: 185 KB
• Volume: 47
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.822265