Hot-carrier stress induced degradation of SLS ELA polysilicon TFTs – Effects of gate width variation and device orientation

✍ Scribed by Giannis P. Kontogiannopoulos; Filippos V. Farmakis; Dimitrios N. Kouvatsos; George J. Papaioannou; Apostolos T. Voutsas

• Book ID: 108271625
• Publisher: Elsevier Science
• Year: 2008
• Tongue: English
• Weight: 303 KB
• Volume: 52
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/j.sse.2007.10.008