Hot-carrier-induced degradation for partially depleted SOI 0.25-0.1 μm CMOSFET with 2-nm thin gate oxide

✍ Scribed by Wen-Kuan Yeh; Wen-Han Wang; Yean-Kuen Fang; Mao-Chieh Chen; Fu-Liang Yang

• Book ID: 114616926
• Publisher: IEEE
• Year: 2002
• Tongue: English
• Weight: 559 KB
• Volume: 49
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2002.805617