Hole trapping during low gate bias, high drain bias hot-carrier injection in n-MOSFETs at 77 K

✍ Scribed by Heremans, P.; Groeseneken, G.; Maes, H.E.

• Book ID: 114534552
• Publisher: IEEE
• Year: 1992
• Tongue: English
• Weight: 751 KB
• Volume: 39
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.127475