Highly accurate closed form approximation for frequency-dependent line impedance of a lossy silicon substrate IC interconnect

✍ Scribed by H Ymeri; B Nauwelaers; K Maex; D De Roest; M Stucchi

• Book ID: 104305595
• Publisher: Elsevier Science
• Year: 2002
• Tongue: English
• Weight: 307 KB
• Volume: 60
• Category: Article
• ISSN: 0167-9317
• DOI: 10.1016/s0167-9317(01)00578-0

✦ Synopsis

A new analytic model is presented to calculate the frequency-dependent distributed self and mutual inductance and the associated distributed series resistance of silicon semiconducting IC interconnects. The method is based on the induced current density distribution inside silicon substrate. The validity of the proposed model has been checked by a comparison with a quasi-TEM spectral domain approach and equivalent-circuit modeling procedure. It is found that the silicon semiconducting substrate skin effect must be considered for the accurate prediction of the high-frequency characteristics of IC interconnects.