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High-voltage electron-microscopical observation of crack-tip dislocations in silicon crystals

✍ Scribed by Masaki Tanaka; Kenji Higashida

Publisher: Elsevier Science
Year: 2005
Tongue: English
Weight: 290 KB
Volume: 400-401
Category: Article
ISSN: 0921-5093
DOI: 10.1016/j.msea.2005.02.084

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