High-throughput characterization of composition-spread manganese oxide films with a scanning SQUID microscope

✍ Scribed by T Hasegawa; T Kageyama; T Fukumura; N Okazaki; M Kawasaki; H Koinuma; Y.K Yoo; F Duewer; X.-D Xiang

• Book ID: 108417672
• Publisher: Elsevier Science
• Year: 2002
• Tongue: English
• Weight: 237 KB
• Volume: 189
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/s0169-4332(01)01011-x