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High-Temperature Thermoelectric Characterization of III–V Semiconductor Thin Films by Oxide Bonding

✍ Scribed by Je-Hyeong Bahk; Gehong Zeng; Joshua M. O. Zide; Hong Lu; Rajeev Singh; Di Liang; Ashok T. Ramu; Peter Burke; Zhixi Bian; Arthur C. Gossard; Ali Shakouri; John E. Bowers

Book ID
107456944
Publisher
Springer US
Year
2010
Tongue
English
Weight
563 KB
Volume
39
Category
Article
ISSN
0361-5235

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