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Characterization of high refractive index semiconductor films by surface plasmon resonance

โœ Scribed by Patskovsky, Sergiy ;Bah, Souleymane ;Meunier, Michel ;Kabashin, Andrei V.

Book ID
115353075
Publisher
The Optical Society
Year
2006
Tongue
English
Weight
560 KB
Volume
45
Category
Article
ISSN
1559-128X

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