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High temperature stability of plasma-enhanced chemically vapour deposited titanium silicide due to two-step rapid thermal annealing

โœ Scribed by Tohru Hara; Yoshiro Ishizawa; Diederik G. Hemmes; Richard S. Rosler


Publisher
Elsevier Science
Year
1988
Tongue
English
Weight
421 KB
Volume
157
Category
Article
ISSN
0040-6090

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