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High-temperature leakage current suppression in CMOS integrated circuits

✍ Scribed by Nordquist, S.E.; Haslett, J.W.; Trofimenkoff, F.N.


Book ID
115453434
Publisher
The Institution of Electrical Engineers
Year
1989
Tongue
English
Weight
300 KB
Volume
25
Category
Article
ISSN
0013-5194

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