High-resolution x-ray spectromicroscopy with the Tokyo electron beam ion trap

✍ Scribed by Nakamura, N.; Faenov, A. Ya.; Pikuz, T. A.; Nojikawa, E.; Shiraishi, H.; Currell, F. J.; Ohtani, S.

• Book ID: 121005821
• Publisher: American Institute of Physics
• Year: 1999
• Tongue: English
• Weight: 884 KB
• Volume: 70
• Category: Article
• ISSN: 0034-6748
• DOI: 10.1063/1.1149648