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High-resolution transmission electron microscopy study on bipolar resistive switching behavior in TiO2 thin films

✍ Scribed by Ying Li; Gaoyang Zhao; Xiaofei Zhou; Lining Pan; Yang Ren


Book ID
113810392
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
776 KB
Volume
15
Category
Article
ISSN
1369-8001

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The authors investigated defect structures introduced into so-called infinite-layer SrCuO 2 thin films sputtered on a SrTiO3 (100) snbstrate. By means of both cross-sectional and plan-view high-resolution electron microscopy (HREM), it has been revealed that the films were epitaxially grown with the