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High-resolution transmission electron microscopy of phase formation and growth in metal–Si–Ge systems

✍ Scribed by L.J. Chen; J.B. Lai; C.S. Lee

Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
463 KB
Volume
33
Category
Article
ISSN
0968-4328

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✦ Synopsis

High-resolution transmission electron microscopy (HRTEM) in conjunction with nano-beam (NB) analysis as well as energy dispersive spectrometry analysis have been fruitfully utilized to study the interfacial reactions in the metal±Si±Ge systems. In this paper we report the results of TEM study of the phase formation and growth in Ti±Si±Ge, Cu±Si±Ge and Ni±Si±Ge systems.

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