High-resolution photoinduced transient spectroscopy of defect centers in vanadium-doped semi-insulating SiC

✍ Scribed by Paweł Kamiński; Roman Kozłowski; Marcin Miczuga; Michał Pawłowski; Michał Kozubal; Mariusz Pawłowski

• Publisher: Springer US
• Year: 2008
• Tongue: English
• Weight: 296 KB
• Volume: 19
• Category: Article
• ISSN: 0957-4522
• DOI: 10.1007/s10854-008-9576-6