Characterization of deep centers in semi-insulating SiC and HgI2: Application of discharge current transient spectroscopy

✍ Scribed by Hideharu Matsuura; Miyuki Takahashi; Shunji Nagata; Kazuo Taniguchi

• Publisher: Springer US
• Year: 2007
• Tongue: English
• Weight: 409 KB
• Volume: 19
• Category: Article
• ISSN: 0957-4522
• DOI: 10.1007/s10854-007-9454-7