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High-resolution measurements of angle-resolved X-ray scattering from optically flat mirrors

✍ Scribed by Matsushita, T. ;Ishikawa, T. ;Kohra, K.

Book ID: 114499661
Publisher: International Union of Crystallography
Year: 1984
Tongue: English
Weight: 880 KB
Volume: 17
Category: Article
ISSN: 0021-8898
DOI: 10.1107/s002188988401147x

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