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High-Resolution Lattice Parameter Measurement by X-Ray Grazing Incidence Diffraction

โœ Scribed by Metzger, T. H. ;Pietsch, U. ;Gartstein, E.


Publisher
John Wiley and Sons
Year
1999
Tongue
English
Weight
222 KB
Volume
174
Category
Article
ISSN
0031-8965

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