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πŸ“

High-Resolution Imaging and Spectrometry of Materials

✍ Scribed by F. Ernst, W. Sigle (auth.), Prof. Dr. Frank Ernst, Prof. Dr.Dr.h.c. Manfred Rühle (eds.)


Publisher
Springer-Verlag Berlin Heidelberg
Year
2003
Tongue
English
Leaves
453
Series
Springer Series in Materials Science 50
Edition
1
Category
Library

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✦ Synopsis


This book gives a survey of and systematic introduction to high-resolution electron microscopy. The method is carefully discussed, the latest developments are reported, and the application to surface and interface analysis and to the study of hidden structures is presented. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students.

✦ Table of Contents


Front Matter....Pages I-XIV
Microcharacterisation of Materials....Pages 1-8
Electron Scattering....Pages 9-68
Structure Determination by Quantitative High-Resolution Transmission Electron Microscopy....Pages 69-118
Quantitative Analytical Transmission Electron Microscopy....Pages 119-187
Advances in Electron Optics....Pages 189-270
Tomography by Atom Probe Field Ion Microscopy....Pages 271-320
Scanning Tunneling Microscopy (STM) and Spectroscopy (STS), Atomic Force Microscopy (AFM)....Pages 321-362
Multi-Method High-Resolution Surface Analysis with Slow Electrons....Pages 363-390
From Microcharacterization to Macroscopic Property: A Pathway Discussed on Metal/Ceramic Composites....Pages 391-418
Microstructural Characterization of Materials: An Assessment....Pages 419-433
Back Matter....Pages 435-442

✦ Subjects


Surfaces and Interfaces, Thin Films;Solid State Physics;Spectroscopy and Microscopy;Characterization and Evaluation of Materials;Physical Chemistry


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