High resolution flat crystal spectrometer for the Shanghai EBIT

✍ Scribed by Xiao, J.; Gao, Y.; Zhang, X.; Lu, D.; Hu, W.; Gao, M.; Chen, W.; Zou, Y.

• Book ID: 120461444
• Publisher: American Institute of Physics
• Year: 2008
• Tongue: English
• Weight: 677 KB
• Volume: 79
• Category: Article
• ISSN: 0034-6748
• DOI: 10.1063/1.2970942