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Umweg peak high resolution flat crystal x-ray spectrometer

✍ Scribed by N.G. Alexandropoulos; K.T. Kotsis

Publisher: Elsevier Science
Year: 1992
Tongue: English
Weight: 321 KB
Volume: 81
Category: Article
ISSN: 0038-1098
DOI: 10.1016/0038-1098(92)90607-b

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