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High-resolution flash time-to-digital conversion and calibration for system-on-chip testing

✍ Scribed by Levine, P.M.; Roberts, G.W.

Book ID: 114448625
Publisher: The Institution of Electrical Engineers
Year: 2005
Tongue: English
Weight: 616 KB
Volume: 152
Category: Article
ISSN: 1350-2387
DOI: 10.1049/ip-cdt:20045063

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