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[IEEE 2010 17th IEEE International Conference on Electronics, Circuits and Systems - (ICECS 2010) - Athens, Greece (2010.12.12-2010.12.15)] 2010 17th IEEE International Conference on Electronics, Circuits and Systems - Calibration of high-resolution flash ADCS based on histogram test methods

✍ Scribed by Jalili, A.; Sayedi, S. M.; Wikner, J J; Palmkvist, K.; Vesterbacka, M.

Book ID: 115461975
Publisher: IEEE
Year: 2010
Weight: 983 KB
Volume: 0
Category: Article
ISBN: 1424481554
DOI: 10.1109/icecs.2010.5724467

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