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High-Resolution Electron Microscopy Observations of Stacking Faults in β-SiC

✍ Scribed by Kunihito Koumoto; Shunji Takeda; Chul Hoon Pai; Takayori Sato; Hiroaki Yanagida


Book ID
110824147
Publisher
John Wiley and Sons
Year
1989
Tongue
English
Weight
352 KB
Volume
72
Category
Article
ISSN
0002-7820

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