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High-resolution core-level studies of silicon surfaces

✍ Scribed by R.I.G. Uhrberg; E. Landemark; Y.-C. Chao

Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 1007 KB
Volume: 75
Category: Article
ISSN: 0368-2048
DOI: 10.1016/0368-2048(95)02538-3

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