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High-resistivity layers in n-InP produced by Fe ion implantation

โœ Scribed by J.P. Donnelly; C.E. Hurwitz


Book ID
107856370
Publisher
Elsevier Science
Year
1978
Tongue
English
Weight
317 KB
Volume
21
Category
Article
ISSN
0038-1101

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Recent advances in high dose ion implantation The surface properties such as depth profile, techniques have produced silicon-on-insulator chemical bond and structure, and electrical prop-(SOI) substrates for the fabrication of electronic erties of oxide and nitride layers in aluminium devices. Oxyge