High-Quality Schottky Contacts for Limiting Leakage Currents in Ge-Based Schottky Barrier MOSFETs

✍ Scribed by Husain, M.K.; Li, X.V.; de Groot, C.H.

• Book ID: 114619323
• Publisher: IEEE
• Year: 2009
• Tongue: English
• Weight: 811 KB
• Volume: 56
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2008.2011724