Microstructure characterization of high-
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Dirras, Guy ;Chauveau, Thierry ;Abdul-Latif, Akrum ;Ramtani, Salah ;Bui, Quang-H
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Article
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2010
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John Wiley and Sons
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English
⚖ 373 KB
## Abstract Fine‐grained aluminum (700–1000 nm) was processed by dynamic severe plastic deformation of coarse‐grained (3 mm) pure aluminum (99.999 wt.%). The resulting microstructure was characterized by transmission electron microscopy (TEM) and X‐ray profile analyses. It is observed that the grai