Microstructure characterization of high-purity aluminum processed by dynamic severe plastic deformation

✍ Scribed by Dirras, Guy ;Chauveau, Thierry ;Abdul-Latif, Akrum ;Ramtani, Salah ;Bui, Quang-Hien

• Publisher: John Wiley and Sons
• Year: 2010
• Tongue: English
• Weight: 373 KB
• Volume: 207
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.201026093

✦ Synopsis

Abstract

Fine‐grained aluminum (700–1000 nm) was processed by dynamic severe plastic deformation of coarse‐grained (3 mm) pure aluminum (99.999 wt.%). The resulting microstructure was characterized by transmission electron microscopy (TEM) and X‐ray profile analyses. It is observed that the grain size determined by TEM departs from measurements made by X‐ray profile analysis. In the latter case, the average crystallite size determined over the global crystallographic or on the deformation‐induced texture components, namely {123} 〈 751 〉, {100} 〈 011〉, and {223} 〈 154 〉, yields similar values (∼225 nm). By contrast, the dislocation density determined on these texture components is about two times higher than the one measured on the global texture. The difference might be related to the specificities of the induced crystallographic texture.