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High pressure x-ray diffraction measurements on Mg2SiO4 glass

✍ Scribed by C.J. Benmore; E. Soignard; M. Guthrie; S.A. Amin; J.K.R. Weber; K. McKiernan; M.C. Wilding; J.L. Yarger

Book ID: 116672690
Publisher: Elsevier Science
Year: 2011
Tongue: English
Weight: 695 KB
Volume: 357
Category: Article
ISSN: 0022-3093
DOI: 10.1016/j.jnoncrysol.2010.12.064

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