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High-pressure single-crystal X-ray diffraction of Tl2SeO4

✍ Scribed by Andrzej Grzechnik; Tomasz Breczewski; Karen Friese

Publisher: Elsevier Science
Year: 2008
Tongue: English
Weight: 318 KB
Volume: 181
Category: Article
ISSN: 0022-4596
DOI: 10.1016/j.jssc.2008.07.015

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