High frequency measurement of Q-factors of ceramic chip capacitors : John P. Maher, Robert T. Jacobsen and Raymond E. Lafferty. Proc. IEEE 28th Electron. Components Conf., Anaheim, 24–26 April 1978, p. 190

• Publisher: Elsevier Science
• Year: 1978
• Tongue: English
• Weight: 118 KB
• Volume: 18
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(78)90822-3