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Detection of cracking during rotational soldering of a high reliability and voltage ceramic capacitor : Mark F. Carlos and Min-Chung Jon. Proc. IEEE 28th Electron. Components Conf., Anaheim, 24–26 April 1978, p. 336


Publisher
Elsevier Science
Year
1978
Tongue
English
Weight
121 KB
Volume
18
Category
Article
ISSN
0026-2714

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