High definition aperture probes for near-field optical microscopy fabricated by focused ion beam milling

✍ Scribed by Veerman, J. A.; Otter, A. M.; Kuipers, L.; van Hulst, N. F.

• Book ID: 120456191
• Publisher: American Institute of Physics
• Year: 1998
• Tongue: English
• Weight: 502 KB
• Volume: 72
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.121564