✦ LIBER ✦

Helium effusion measurements for studying the microstructure of a-SiC:H films deposited by d.c. sputtering

✍ Scribed by Saleh, R; Munisa, L; Beyer, W

Book ID: 122515762
Publisher: Elsevier Science
Year: 2003
Tongue: English
Weight: 118 KB
Volume: 12
Category: Article
ISSN: 0925-9635
DOI: 10.1016/S0925-9635(03)00207-3

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

A comparative study of Ar and H2 as carr

A comparative study of Ar and H2 as carrier gases for the growth of SiC films on Si(100) by electron cyclotron resonance chemical vapor deposition at low temperature

✍ Lee, Wen-Horng; Lin, Jing-Cheng; Lee, Chiapyng; Cheng, Huang-Chung; Yew, Tri-Run 📂 Article 📅 2001 🏛 Elsevier Science 🌐 English ⚖ 591 KB

Standard reference material proposed for

Standard reference material proposed for enthalpy-of-sublimation measurements. A comparative study of the standard molar enthalpy of sublimation of Fe(c-C5H5)2(ferrocene) by calorimetry and knudsen-effusion techniques

✍ Luis Alfonso Torres; Ramón Gudiño; Raphaël Sabbah; Juan Antonio Guardado 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 350 KB

The standard molar enthalpy of sublimation of Fe(c-C5H5)2,bis(h-cyclopentadienyl)iron(II), ferrocene, has been experimentally determined by the Knudsen-effusion method using a quartz-crystal microbalance. The results from two series of experiments were found to be DsubH°m(298.15 K)=(74.3420.41) kJ•m