Heavy-Ion Induced Single Event Gate Damage in Medium Voltage Power MOSFETs

✍ Scribed by Busatto, Giovanni; Curro, Giuseppe; Iannuzzo, Francesco; Porzio, Antonino; Sanseverino, Annunziata; Velardi, Francesco

• Book ID: 118277147
• Publisher: IEEE
• Year: 2009
• Tongue: English
• Weight: 683 KB
• Volume: 56
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/tns.2009.2032397