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[Hartung-Gorre Verlag ISPSD'94 International Symposium on Power Semiconductor Devices and IC's - Davos, Switzerland (31 May-2 June 1994)] Proceedings of the 6th International Symposium on Power Semiconductor Devices and Ics - Turn-off failure mechanisms in large (2.2 kV, 20 A) MCT devices

✍ Scribed by Lendenmann, H.; Fichtner, W.

Book ID: 115471686
Publisher: Hartung-Gorre Verlag
Year: 1994
Weight: 753 KB
Volume: 0
Category: Article
ISBN-13: 9783891917848
DOI: 10.1109/ispsd.1994.583724

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