Hard-x-ray microscopy with Fresnel zone plates reaches 40 nm Rayleigh resolution

✍ Scribed by Chu, Y. S.; Yi, J. M.; De Carlo, F.; Shen, Q.; Lee, Wah-Keat; Wu, H. J.; Wang, C. L.; Wang, J. Y.; Liu, C. J.; Wang, C. H.; Wu, S. R.; Chien, C. C.; Hwu, Y.; Tkachuk, A.; Yun, W.; Feser, M.; Liang, K. S.; Yang, C. S.; Je, J. H.; Margaritondo, G.

• Book ID: 119962738
• Publisher: American Institute of Physics
• Year: 2008
• Tongue: English
• Weight: 691 KB
• Volume: 92
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.2857476