Handbook of Microscopy Set: Applications in Materials Science, Solid-State Physics and Chemistry: Vols. 1+2+3

• Publisher: VCH Verlagsgesellschaft mbH
• Year: 1997
• Tongue: English
• Leaves: 1963
• Category: Library

✦ Synopsis

Comprehensive in coverage, written and edited by leading experts in the field, this Handbook is a definitive, up-to-date reference work. The Volumes Methods I and Methods II detail the physico-chemical basis and capabilities of the various microscopy techniques used in materials science. The Volume Applications illustrates the results obtained by all available methods for the main classes of materials, showing which technique can be successfully applied to a given material in order to obtain the desired information.

With the Handbook of Microscopy, scientists and engineers involved in materials characterization will be in a position to answer two key questions: "How does a given technique work?", and "Which techique is suitable for characterizing a given material?"

Content:
Chapter 1 Metals and Alloys (pages 5–110):
Chapter 2 Microscopy of Rocks and Minerals (pages 111–144):
Chapter 3 Semiconductors and Semiconductor Devices (pages 145–205):
Chapter 4 Optoelectronic Materials (pages 207–233):
Chapter 5 Domain Structures in Ferroic Materials (pages 235–251):
Chapter 6 Microscopy of Structural Ceramics (pages 253–292):
Chapter 7 Microscopy of Gemmological Materials (pages 293–320):
Chapter 8 Superconducting Ceramics (pages 321–383):
Chapter 9 Non?Periodic Structures (pages 385–410):
Chapter 10 Medical and Dental Materials (pages 411–436):
Chapter 11 Carbon (pages 437–482):
Chapter 12 Composite Structural Materials (pages 483–506):
Chapter 13 The Structure of Polymers and Their Monomeric Analogs (pages 507–582):
Chapter 14 Nuclear Materials (pages 583–664):
Chapter 15 Magnetic Microscopy (pages 665–687):
Chapter 1 Small Particles (pages 691–737):
Chapter 2 Structural Phase Transformations (pages 739–750):
Chapter 3 Preparation Techniques for Transmission Electron Microscopy (pages 751–801):
Chapter 4 Environmental Problems (pages 803–819):
Chapter 5 Quantitative Hyleography: The Determination of Quantitative Data from Micrographs (pages 821–833):
Chapter 1 Fundamentals of Light Microscopy (pages 7–31):
Chapter 2 Optical Contrasting of Microstructures (pages 33–53):
Chapter 3 Raman Microscopy (pages 55–69):
Chapter 4 Three?Dimensional Light Microscopy (pages 71–82):
Chapter 5 Near Field Optical Microscopy (pages 83–96):
Chapter 6 Infrared Microscopy (pages 97–115):
Chapter 1 Soft X?Ray Imaging (pages 119–129):
Chapter 2 X?Ray Microradiography (pages 149–161):
Chapter 3 X?Ray Microtomography (pages 149–161):
Chapter 4 Soft X?Ray Microscopy by Holography (pages 163–176):
Chapter 5 X?Ray Diffraction Topography (pages 195–241):
Chapter 1 Acoustic Microscopy (pages 194–241):
Chapter 1.1 Stationary Beam Methods: Transmission Electron Microscopy (pages 246–351):
Chapter 1.1.2 High?Resolution Electron Microscopy (pages 353–406):
Chapter 1.2 Reflection Electron Microscopy (pages 407–424):
Chapter 1.3 Electron Energy?Loss Spectroscopy Imaging (pages 425–445):
Chapter 1.4 High Voltage Electron Microscopy (pages 447–465):
Chapter 1.5 Convergent Beam Electron Diffraction (pages 467–485):
Chapter 1.6 Low?Energy Electron Microscopy (pages 487–503):
Chapter 1.7 Lorentz Microscopy (pages 505–514):
Chapter 1.8 Electron Holography Methods (pages 515–536):
Chapter 2.1 Scanning Electron Microscopy (pages 539–561):
Chapter 2.2 Scanning Transmission Electron Microscopy (pages 563–594):
Chapter 2.3 Scanning Transmission Electron Microscopy: Z Contrast (pages 595–620):
Chapter 2.4 Scanning Auger Microscopy (SAM) and Imaging X?Ray Photoelectron Spectroscopy (XPS) (pages 621–640):
Chapter 2.5 Scanning Microanalysis (pages 641–659):
Chapter 2.6 Imaging Secondary Ion Mass Spectrometry (pages 691–716):
Chapter 1 Nuclear Magnetic Resonance (pages 719–734):
Chapter 2 Scanning Electron Microscopy with Polarization Analysis (SEMPA) (pages 735–749):
Chapter 3 Spin?Polarized Low?Energy Electron Microscopy (pages 751–759):
Chapter 1 Photoelectron Emission Microscopy (pages 763–773):
Chapter 2 Field Emission and Field Ion Microscopy (Including Atom Probe FIM) (pages 775–801):
Chapter 1 Scanning Tunneling Microscopy (pages 809–826):
Chapter 2 Scanning Force Microscopy (pages 828–844):
Chapter 3 Magnetic Force Microscopy (pages 845–853):
Chapter 4 Ballistic Electron Emission Microscopy (pages 855–882):
Chapter 1 Image Recording in Microscopy (pages 885–921):
Chapter 2 Image Processing (pages 923–952):
Chapter 1 Coincidence Microscopy (pages 955–962):
Chapter 2 Low Energy Electron Holography and Point?Projection Microscopy (pages 963–986):