Handbook of Microscopy: Methods II: Applications in Materials Science, Solid-State Physics and Chemistry, Volume 2

Publisher: VCH Verlagsgesellschaft mbH
Year: 1997
Tongue: English
Leaves: 492
Category: Library

No coin nor oath required. For personal study only.

✦ Synopsis

Comprehensive in coverage, written and edited by leading experts in the field, this Handbook is a definitive, up-to-date reference work. The Volumes Methods I and Methods II detail the physico-chemical basis and capabilities of the various microscopy techniques used in materials science. The Volume Applications illustrates the results obtained by all available methods for the main classes of materials, showing which technique can be successfully applied to a given material in order to obtain the desired information.

With the Handbook of Microscopy, scientists and engineers involved in materials characterization will be in a position to answer two key questions: "How does a given technique work?", and "Which techique is suitable for characterizing a given material?"

Content:
Chapter 2.1 Scanning Electron Microscopy (pages 539–561):
Chapter 2.2 Scanning Transmission Electron Microscopy (pages 563–594):
Chapter 2.3 Scanning Transmission Electron Microscopy: Z Contrast (pages 595–620):
Chapter 2.4 Scanning Auger Microscopy (SAM) and Imaging X?Ray Photoelectron Spectroscopy (XPS) (pages 621–640):
Chapter 2.5 Scanning Microanalysis (pages 641–659):
Chapter 2.6 Imaging Secondary Ion Mass Spectrometry (pages 691–716):
Chapter 1 Nuclear Magnetic Resonance (pages 719–734):
Chapter 2 Scanning Electron Microscopy with Polarization Analysis (SEMPA) (pages 735–749):
Chapter 3 Spin?Polarized Low?Energy Electron Microscopy (pages 751–759):
Chapter 1 Photoelectron Emission Microscopy (pages 763–773):
Chapter 2 Field Emission and Field Ion Microscopy (Including Atom Probe FIM) (pages 775–801):
Chapter 1 Scanning Tunneling Microscopy (pages 809–826):
Chapter 2 Scanning Force Microscopy (pages 828–844):
Chapter 3 Magnetic Force Microscopy (pages 845–853):
Chapter 4 Ballistic Electron Emission Microscopy (pages 855–882):
Chapter 1 Image Recording in Microscopy (pages 885–921):
Chapter 2 Image Processing (pages 923–952):
Chapter 1 Coincidence Microscopy (pages 955–962):
Chapter 2 Low Energy Electron Holography and Point?Projection Microscopy (pages 963–986):

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