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Hall effect measurements on Sb and Ga implanted silicon: Anneal behavior and comparison with other species : N. G. E. Johansson and J. W. Mayer, Solid-St. Electron. 13, (1970), p. 123


Publisher
Elsevier Science
Year
1970
Tongue
English
Weight
50 KB
Volume
9
Category
Article
ISSN
0026-2714

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