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Guided-wave technique for the measurement of dielectric thin-film materials’ thermal properties

✍ Scribed by Huguet-Chantôme, Pascal ;Escoubas, Ludovic ;Flory, François


Book ID
115350018
Publisher
The Optical Society
Year
2002
Tongue
English
Weight
141 KB
Volume
41
Category
Article
ISSN
1559-128X

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