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Guest Editorial: Test and Verification Challenges for Future Microprocessors and SoC Designs

✍ Scribed by Ray, Sandip; Bhadra, Jay; Abadir, Magdy S.; Wang, Li-C

Book ID: 121610739
Publisher: Springer US
Year: 2013
Tongue: English
Weight: 144 KB
Volume: 29
Category: Article
ISSN: 0923-8174
DOI: 10.1007/s10836-013-5411-y

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