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Growth of ultra-thin cerium oxide layers on Cu(1 1 1)

✍ Scribed by V. Matolín; J. Libra; I. Matolínová; V. Nehasil; L. Sedláček; F. Šutara


Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
336 KB
Volume
254
Category
Article
ISSN
0169-4332

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A series of Ni films with thickness from 0.2 monolayers (ML) to 12.5 ML were epitaxially grown on a Pd(1 0 0) substrate at room temperature. Growth and morphology were investigated by scanning tunneling microscopy (STM), reflection-high-energy-electron diffraction (RHEED) and Auger electron spectros