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Growth of SiNx and SiCx thin films by pulsed reactive crossed-beam laser ablation

✍ Scribed by Z. Shi; J.-M. Yang; T. Fan; D. Zhang; R. Wu


Publisher
Springer
Year
2000
Tongue
English
Weight
166 KB
Volume
70
Category
Article
ISSN
1432-0630

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✍ M. Morcrette; P. Barboux; A. Laurent; J. PerriΓ¨re πŸ“‚ Article πŸ“… 1997 πŸ› Elsevier Science 🌐 English βš– 921 KB

Thin films of nasicon structure have been grown from NaM,(PO,), (M = Ti and Zr) targets onto silicon substrates by the laser ablation method. By the complementary use of electron microscopy, Rutherford backscattering spectrometry and X-ray diffraction techniques. the surface morphology of the deposi