๐”– Bobbio Scriptorium
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Growth of anode-to-grid capacitance in low-voltage receiving valves

โœ Scribed by Reynolds, F.H.; Johnson, C.B.; Rogers, M.W.


Book ID
119746072
Publisher
Institution of Electrical Engineers
Year
1957
Weight
821 KB
Volume
104
Category
Article
ISSN
2054-0434

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๐Ÿ“œ SIMILAR VOLUMES


Use of a capacitance voltage technique t
โœ F. Lanckmans; K. Maex ๐Ÿ“‚ Article ๐Ÿ“… 2002 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 237 KB

## 1 Cu drift diffusion in two inorganic low-k materials is evaluated. The diffusion is investigated by measuring shifts in the flatband voltage of capacitance / voltage measurements on Cu gate capacitors after bias temperature 1 stressing. The Cu drift rate in SiO C (2.7 # k # 3.1) is considerabl