Growth, morphological and structural characterization of silicon carbide epilayers for power electronic devices applications

✍ Scribed by C. F. Pirri; S. Porro; S. Ferrero; E. Celasco; S. Guastella; L. Scaltrito; R. Yakimova; M. Syväjärvi; R. R. Ciechonski; S. De Angelis; D. Crippa

• Publisher: John Wiley and Sons
• Year: 2005
• Tongue: English
• Weight: 387 KB
• Volume: 40
• Category: Article
• ISSN: 0232-1300
• DOI: 10.1002/crat.200410468