Growth and properties of SrBi2TaNbO9 ferroelectric thin films using pulsed laser deposition

✍ Scribed by Pingxiong Yang; Hongmei Deng; Meirong Shi; Ziyang Tong; Sumei Qin

• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 335 KB
• Volume: 137
• Category: Article
• ISSN: 0921-5107
• DOI: 10.1016/j.mseb.2006.10.017

✦ Synopsis

High quality SrBi 2 TaNbO 9 (SBTN) ferroelectric thin films were fabricated on platinized silicon by pulsed laser deposition. Microstructure and ferroelectric properties of the films were characterized. Optical fatigue (light/bias) for the thin films was studied and the average remanent polarization dropped by nearly 55% due to the bias/illumination treatment. Optical properties of the thin films were studied by spectroscopic ellipsometry (SE) from the ultraviolet to the infrared region. Optical constants, n ∼ 0.16 in the infrared region and n ∼ 2.12 in the visible spectral region, were determined through refractive index functions. The band gap energy is estimated to be 3.93 eV.