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Growth and properties of sputtered zirconia and zirconia–silica thin films

✍ Scribed by D.H. Kuo; C.H. Chien


Book ID
108388631
Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
719 KB
Volume
429
Category
Article
ISSN
0040-6090

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✍ K.P.S.S. Hembram; Gargi Dutta; Umesh V. Waghmare; G. Mohan Rao 📂 Article 📅 2007 🏛 Elsevier Science 🌐 English ⚖ 819 KB

Thin films of ZrO 2 were prepared by reactive magnetron sputtering. Annealing of the films exhibited a drastic change in the properties due to improved crystallinity and packing density. The root mean square roughness of the sample observed from atomic force microscope is about 5.75 nm which is comp