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Growth and photoluminescence of self-assembled islands obtained during the deposition of Ge on a strained SiGe layer

✍ Scribed by D.N. Lobanov; A.V. Novikov; N.V. Vostokov; Y.N. Drozdov; A.N. Yablonskiy; Z.F. Krasilnik; M. Stoffel; U. Denker; O.G. Schmidt


Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
367 KB
Volume
27
Category
Article
ISSN
0925-3467

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✦ Synopsis


The growth and photoluminescence of Ge(Si) self-assembled islands on strained Si 1Γ€x Ge x layers (0 < x < 20%) has been investigated. Both island size and density increase when the Ge content in the predeposited Si 1Γ€x Ge x alloy increases. The increased island density is associated with an enhanced surface roughness after SiGe deposition. The increased island size is attributed to enhanced Si intermixing and to a wetting layer thickness reduction. The latter is caused by accumulation of elastic strain energy in the SiGe layer. The increase in both island size and density leads to a strong interaction between neighboring islands. The island-island interaction results in island self-ordering, which is analyzed using a surface autocorrelation function. The lower Ge content in the islands accounts for the observed blueshift of the island related photoluminescence signal. We observe a room temperature photoluminescence signal for Ge islands grown on a predeposited SiGe alloy which is higher than for Ge islands grown on Si(0 0 1). This result is explained by an increased island density, which provides an efficient way to capture charge carriers in the islands.


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In situ investigation by GISAXS and GIXD
✍ M.-I. Richard; T.-U. SchΓΌlli; E. Wintersberger; G. Renaud; G. Bauer πŸ“‚ Article πŸ“… 2006 πŸ› Elsevier Science 🌐 English βš– 272 KB

The growth mode, strain state and shape of Ge islands were analyzed in situ, during their growth on Si(0 0 1), by combining grazing incidence small angle X-ray scattering (GISAXS) and X-ray diffraction (GIXD) measurements. GISAXS measurements provide the detailed evolution of the shape of the grown